Publications

Harnessing pattern-by-pattern linear classifiers for prediction with missing data (paper)
A. Reyero Lobo, A. Ayme, C. Boyer, A. Dieuleveut, E. Scornet.
Preprint

Random features models: a way to study the success of naive imputation (paper)
A. Ayme, C. Boyer, A. Dieuleveut, E. Scornet.
To appear at The Forty-first International Conference on Machine Learning (ICML24)

Naive imputation implicitly regularizes high-dimensional linear models (paper)
A. Ayme, C. Boyer, A. Dieuleveut, E. Scornet.
The Fortieth International Conference on Machine Learning (ICML23)

Near optimal rate of consistency for linear models with missing values (paper)
A. Ayme, C. Boyer, A. Dieuleveut, E. Scornet.
The Thirty-ninth International Conference on Machine Learning (ICML22)